AMD's new EXPO Ultra Low Latency memory promises tighter timings without manual tuning. We tested G.Skill's latest DDR5 kits ...
Abstract: Recently, Wiener-based remaining useful life (RUL) prediction methods are widely employed to ensure device reliability. However, for high-power insulated gate bipolar transistor (IGBT) ...
Abstract: The parasitic inductance and dynamic current sharing performances of multichip silicon carbide power module packaging limit the device's performance. Moreover, high electrical properties ...