Semiconductor Engineering

Using Graph Attention for Virtual Metrology in Semiconductor Manufacturing (Intel Foundry, ASU)

Researchers from Arizona State University and Intel Foundry have published “Graph Attention-Based Virtual Metrology for Film ...
Semiconductor Engineering

The Sub-2nm Paradox

Reducing variation in manufacturing, monitoring behavior over time, and targeting specific workloads can have a big impact on ...
IEEE

Wafer-Level Heterogeneous Integration of GaN NMOS and CNT PMOS Transistors Using Direct-Immersion Technology

Abstract: In this letter, we demonstrate wafer-level heterogeneous integration of GaN and carbon nanotube (CNT). The work reports the integration of GaN and CNT with minimal device performance ...
IEEE

Generating Temporal Contact Graphs Using Random Walkers

Abstract: We study human mobility networks through timeseries of contacts between individuals. Our proposed Random Walkers Induced temporal Graph (RWIG) model generates temporal graph sequences based ...