Cross-section observation of a specimen using SEM can produce detailed information vital for research and development as well as for failure analysis. Generally, surface observation alone is incapable ...

The critical load causing secondary failure of a deep beam by lateral buckling may be calculated by standard methods for those cases in which the beam behaves elastically under the applied load. When, ...

Say we consider a beam made up of thin layers (laminae) aligned with the longitudinal axis of the beam, and for which the laminae can slide with respect to each other along the longitudinal axis as ...

JEOL USA introduces a new configuration of its broad ion beam milling instrument, the Cross-section Polisher (CP). The CP is widely used for preparing pristine samples prior to high resolution imaging ...

In this video we explore bending and shear stresses in beams. A bending moment is the resultant of bending stresses, which are normal stresses acting perpendicular to the beam cross-section. We can ...