Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...
By combining atomic force microscopy (AFM) with a Hadamard productbased image reconstruction algorithm, scientists ...
New model extracts stiffness and fluidity from AFM data in minutes, enabling fast, accurate mechanical characterization of living cells at single-cell resolution. (Nanowerk Spotlight) Cells are not ...
In July 1985, three physicists—Gerd Binnig of the IBM Zurich Research Laboratory, Christoph Gerber of the University of Basel, and Calvin Quate of Stanford University—puzzled over a problem while ...
First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...
Invented in 1986 atomic force microscopy (AFM) has become a valuable tool for life scientists, offering the ability to image aqueous biological samples, like membranes, at nanometer resolution. The ...
Nanomechanical systems developed at TU Wien have now reached a level of precision and miniaturization that will allow them to ...
“We already have a number of Bruker AFMs in our open-access user facilities and are always looking for new technology that can further support the many researchers we serve from both academia and ...
Atomic force microscopy (AFM) has evolved into an indispensable tool for nanoscale imaging and fabrication, enabling both high-resolution surface characterisation and precise nanomachining. By ...
Researchers at Nano Life Science Institute (WPI-NanoLSI), Kanazawa University report in Small Methods the 3D imaging of a suspended nanostructure. The technique used is an extension of atomic force ...
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